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A 0.65-1.35 GHz synthesizable all-digital phase locked loop with quantization noise suppressing time-to-digital converter

机译:具有量化噪声抑制时间数字转换器的0.65-1.35 GHz可合成全数字锁相环

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This paper presents a new quantization noise suppression method for a time-to-digital converter (TDC) and proposes an all-digital phase-locked loop (ADPLL) architecture using only standard cell logic gates. Using a new multiple input multiple output (MIMO) quantization noise suppression method provides an order of $sqrt {2N} $ improvement in TDC resolution with $N$ parallel TDC channels. Suppressed noise in the TDC allows the ADPLL to achieve superior jitter performance in both theoretical calculations and simulation results. In order to allow fast portability between process nodes, short design cycle time, ease of modification, and flexibility, ADPLL architecture is designed completely in register transfer level intensive Verilog code and the implementation is synthesized in order to obtain final microelectronic design schematics. In comparison to similar work in the literature, postlayout simulation results show that the designed ADPLL achieves period jitter of 1.78 ps$_{rms}$ with a layout area of 0.09 mm$^{2}$ in 65 nm CMOS process and power consumption of 17.5 mW at 800 MHz.
机译:本文提出了一种用于时间数字转换器(TDC)的新型量化噪声抑制方法,并提出了仅使用标准单元逻辑门的全数字锁相环(ADPLL)架构。使用新的多输入多输出(MIMO)量化噪声抑制方法,在并行TDC通道$ N $的情况下,TDC分辨率提高了 sqrt {2N} $。抑制了TDC中的噪声,使得ADPLL在理论计算和仿真结果上均具有出色的抖动性能。为了实现过程节点之间的快速可移植性,较短的设计周期时间,易于修改和灵活性,ADPLL体系结构完全采用寄存器传输级密集的Verilog代码进行设计,并对实现进行综合以获取最终的微电子设计原理图。与文献中的类似工作相比,后期布局仿真结果表明,所设计的ADPLL在65 nm CMOS工艺和功耗下实现了1.78 ps $ _ {rms} $的周期抖动,布局面积为0.09 mm $ ^ {2} $。 800 MHz时为17.5 mW

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