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Origin of the Electric Property Change of a Single-Wall Carbon Nanotube Caused by Low-Energy Irradiation: Defects or Substrate Charging?

机译:低能辐照引起的单壁碳纳米管电性能变化的起因:是缺陷还是基板充电?

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Low-energy irradiation-induced conductivity decrease of a single-wall carbon nanotube has been well established experimentally. However, its origin is still controversial. Irradiation effects on suspended single-wall carbon nanotubes, which are much less affected by substrate charging effects, were studied to distinguish possible origins. The results indicate that the conductivity decrease is not caused by substrate charging, but by irradiation-induced defect formation. [DOI: 10.1380/ejssnt.2011.103]
机译:低能量辐照引起的单壁碳纳米管电导率的降低已经通过实验得到了很好的证实。但是,其起源仍存在争议。研究了对悬浮单壁碳纳米管的辐照效应,该辐照效应受基材带电效应的影响要小得多,以区分可能的起源。结果表明,电导率的降低不是由基板带电引起的,而是由辐照引起的缺陷形成引起的。 [DOI:10.1380 / ejssnt.2011.103]

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