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首页> 外文期刊>Carbon: An International Journal Sponsored by the American Carbon Society >Activation energy of healing of low-energy irradiation- induced defects in single-wall carbon nanotubes
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Activation energy of healing of low-energy irradiation- induced defects in single-wall carbon nanotubes

机译:低能辐射诱导的单壁碳纳米管缺陷修复的活化能

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We analyzed defects created by low-energy irradiation in single-wall carbon nanotubes (SWCNTs) using Raman spectroscopy. The analysis is based on the recovery curves of the G/D ratio and there is no need to assume a specific functional form between the G/D ratio and the defect density. The obtained activation energies of defect healing are 0.7 or 1.4 eV, depending on the extent of the damage, which are close to the values for recombination barriers of vacancy-adatom defects. Calculated recovery curves of the G/D ratio at room temperature show that the recovery is so slow that almost no recovery is observed in a usual time scale, which is consistent with experimental results.
机译:我们使用拉曼光谱分析了单壁碳纳米管(SWCNTs)中低能辐照产生的缺陷。该分析基于G / D比的恢复曲线,并且无需在G / D比与缺陷密度之间采取特定的功能形式。根据损伤的程度,获得的缺陷愈合的活化能为0.7或1.4 eV,接近于空位-原子缺陷的复合势垒值。计算出的室温下G / D比的恢复曲线表明,恢复如此缓慢,以至于在通常的时间范围内几乎没有观察到恢复,这与实验结果一致。

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