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Effects of Silicon on Tolerance to Water Deficit and Heat Stress in Rice Plants(Oryza sativa L.), Monitored by Electrolyte Leakage

机译:电解质渗漏监测硅对水稻(Oryza sativa L.)耐缺水和热胁迫的影响

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To evaluate the positive effects of silicon on the stress tolerance of rice plants, we measured the electrolyte leakage (El) from leaf tissue caused by desiccation with polyethylene glycol (PEG) and by high temperature to estimate the integrity of cell membranes. The El caused by 30% and 40% solutions of PEG decreased with the increase in the level of Si in leaves. In leaves of plants grown with 100 ppm SiO2, the level of polysaccharides in cell walls, which is one of the factors related to tolerance to desiccation, was 1.6-fold higher than that in leaves of plants grown without Si. Ultrastructural observations of leaves revealed that polymerized Si accumulated in the walls of epidermal cells but not in those of the mesophyll cells, which are probably the main sites of El. These findings suggested that silicon in rice leaves is involved in the water relations of cells, such as mechanical properties and water permeability and plays a role in preventing El through the synthesis and functions of cell walls. The El caused by high temperature (42.5°C) was also lower in the leaves grown with Si than in the leaves grown without Si, suggesting the involvement of silicon in the thermal stability of lipids in cell membranes. These results suggested that silicon prevents the structural and functional deterioration of cell membranes when rice plants are exposed to environmental stress.
机译:为了评估硅对水稻植物抗逆性的积极影响,我们测量了由聚乙二醇(PEG)干燥和高温引起的叶片组织中的电解质渗漏(El),以评估细胞膜的完整性。 30%和40%的PEG溶液引起的El随叶片中Si含量的增加而降低。在含有100 ppm SiO2的植物的叶片中,细胞壁中的多糖水平是干燥耐性的相关因素之一,是无硅植物的叶片中1.6倍。叶片的超微结构观察表明,聚合的Si积累在表皮细胞壁中,而不是在叶肉细胞壁中,这可能是El的主要部位。这些发现表明,稻叶中的硅参与了细胞的水关系,例如机械性能和透水性,并通过细胞壁的合成和功能在阻止E1发挥作用。高温(42.5°C)引起的El在含Si的叶片中也比不含Si的叶片低,这表明硅参与了细胞膜中脂质的热稳定性。这些结果表明,当水稻植物暴露于环境胁迫下时,硅可以防止细胞膜的结构和功能退化。

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