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Grain Refinement in Copper via Cryogenic Deformation

机译:通过低温变形精炼铜的晶粒

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The high-resolution electron backscatter diffraction (EBSD) was employed to study microstructure produced by cryogenic high-pressure torsion of copper. The long term (~11 months) thermal stability of the obtained material at room temperature was also evaluated. It has been established that severe cryogenic deformation leads to a considerable grain refinement down to 0.3 μm. However the obtained material was shown to be quite unstable exhibiting abnormal grain growth at ambient temperature.
机译:高分辨率电子背散射衍射(EBSD)用于研究铜的低温高压扭转产生的微观结构。还评估了所得材料在室温下的长期(〜11个月)热稳定性。已经证实,严重的低温变形导致低至0.3μm的相当大的晶粒细化。然而,显示出所获得的材料非常不稳定,在环境温度下表现出异常的晶粒生长。

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