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Performance Test and Evaluation for Pixel CdZnTe Detector of Different Thickness

机译:不同厚度像素CdZnTe探测器的性能测试与评估

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The aim of this study is to get the photon energy suitable for different thickness detector, different photon energy acts on pixel CdZnTe detector of different thickness. We can obtain the energy spectrum estimation, energy resolution and peak efficiency by the experiment and simulation with the radiation source of 241Am and 137Cs acting on pixel CdZnTe detector. From experiment results, it can be found that at the high energy of 662 keV the thicker the CdZnTe detector is, the higher the energy resolution and peak efficiency is while at the low energy of 59.5 keV tailing increases and charge is loss. It also can be found the characteristic of detector is better at the low energy when the detector thickness is thinner.
机译:本研究的目的是使光子能量适合于不同厚度的探测器,不同的光子能量作用于不同厚度的像素CdZnTe探测器。通过对241Cm和137Cs辐射源作用于像素CdZnTe检测器进行实验和仿真,可以得到能谱估计,能量分辨率和峰值效率。从实验结果可以发现,在662 keV的高能量下,CdZnTe检测器越厚,能量分辨率和峰值效率就越高,而在59.5 keV的低能量下,拖尾增加并且电荷损失。还可以发现,当探测器厚度较薄时,探测器在低能量下的性能更好。

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