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Design of Field-programmable Operational Transresistance Amplifier using Floating-gate MOSFETs

机译:使用浮栅MOSFET的现场可编程运算跨阻放大器的设计

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We propose a comprehensive design procedure to design Field-programmable/Reconfigurable Analog Integrated CMOS circuits. Instead of repeatedly iterative simulation steps to achieve desired design specifications by fine tuning the W/L ratios of the FETs, we use first order classroom equations to achieve central value of desired specifications and then execute a customized fine tuning of specifications to the customers requirement with the help of Floating-gate Transistors FGMOS. To demonstrate the proposed design cycle, a modified high frequency/RF Operational Transresistance Amplifier (OTRA) CMOS circuit is designed where transresistance gain and input output low impedances are programmable, independently to desired values within a specific field range, using FGMOSs. In FGMOS the programmable charge at floating-gate using external voltages can results in threshold voltage field-programming, which in turn program the design (OTRA) specifications. With specific sizing and biasing condition, the transresistance can be programmed from 0.5kohm to 6kohm, input and output impedance from 600ohm to 10Kohm, while offset current can also be compensated independently using respective FGMOSs with 13-bit programming precision. However the final circuit, with four FGMOS occupies 75μm × 64μm chip area. The design also consumes less power, total power consumption is about 3.96mW and show good thermal stability as output voltage variation with temperature is about 25μV/°C.
机译:我们提出了一个全面的设计程序来设计现场可编程/可重构模拟集成CMOS电路。我们不使用重复的仿真步骤来通过微调FET的W / L比来达到所需的设计规格,而是使用一阶课堂方程式来获得所需规格的中心值,然后根据客户要求对规格进行定制的微调。浮栅晶体管FGMOS的帮助。为了演示提议的设计周期,设计了一种改进的高频/ RF运算跨阻放大器(OTRA)CMOS电路,其中使用FGMOS可将跨阻增益和输入输出低阻抗可编程为独立于特定场范围内的所需值。在FGMOS中,使用外部电压对浮栅处的可编程电荷可导致阈值电压现场编程,进而对设计(OTRA)规范进行编程。在特定的尺寸和偏置条件下,可以将跨阻编程为0.5kohm至6kohm,输入和输出阻抗为600ohm至10Kohm,同时还可以使用具有13位编程精度的各个FGMOS独立补偿失调电流。然而,具有四个FGMOS的最终电路占用75μm×64μm的芯片面积。该设计还消耗更少的功率,总功耗约为3.96mW,并具有良好的热稳定性,因为输出电压随温度的变化约为25μV/°C。

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