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Quadrilateral Micro-Hole Array Machining on Invar Thin Film: Wet Etching and Electrochemical Fusion Machining

机译:Invar薄膜上的四边形微孔阵列加工:湿蚀刻和电化学熔融加工

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Ultra-precision products which contain a micro-hole array have recently shown remarkable demand growth in many fields, especially in the semiconductor and display industries. Photoresist etching and electrochemical machining are widely known as precision methods for machining micro-holes with no residual stress and lower surface roughness on the fabricated products. The Invar shadow masks used for organic light-emitting diodes (OLEDs) contain numerous micro-holes and are currently machined by a photoresist etching method. However, this method has several problems, such as uncontrollable hole machining accuracy, non-etched areas, and overcutting. To solve these problems, a machining method that combines photoresist etching and electrochemical machining can be applied. In this study, negative photoresist with a quadrilateral hole array pattern was dry coated onto 30-μm-thick Invar thin film, and then exposure and development were carried out. After that, photoresist single-side wet etching and a fusion method of wet etching-electrochemical machining were used to machine micro-holes on the Invar. The hole machining geometry, surface quality, and overcutting characteristics of the methods were studied. Wet etching and electrochemical fusion machining can improve the accuracy and surface quality. The overcutting phenomenon can also be controlled by the fusion machining. Experimental results show that the proposed method is promising for the fabrication of Invar film shadow masks.
机译:包含微孔阵列的超精密产品最近在许多领域显示出惊人的需求增长,尤其是在半导体和显示行业。光刻胶蚀刻和电化学加工是众所周知的精密方法,用于加工微孔,而在所制造的产品上没有残留应力且表面粗糙度较低。用于有机发光二极管(OLED)的殷钢荫罩包含许多微孔,目前是通过光致抗蚀剂蚀刻方法加工的。但是,这种方法存在一些问题,例如无法控制的孔加工精度,未蚀刻的区域和过度切削。为了解决这些问题,可以采用将光刻胶蚀刻和电化学加工相结合的加工方法。在这项研究中,将具有四边形孔阵列图案的负性光刻胶干涂到30μm厚的Invar薄膜上,然后进行曝光和显影。之后,使用光致抗蚀剂单面湿法蚀刻和湿法蚀刻-电化学加工的熔融方法在因瓦合金上加工微孔。研究了该方法的孔加工几何形状,表面质量和切削特性。湿法蚀刻和电化学熔融加工可提高精度和表面质量。过切现象也可以通过熔融加工来控制。实验结果表明,该方法可用于制造殷钢薄膜荫罩。

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