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SIMULATION OF THE LEAKAGE EFFECT IN CAPACITIVE SENSING

机译:电容感测中泄漏效应的模拟

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In the measurement of mutual capacitance between electrodes both the coupling and the leakage effect contribute to the measurement result whereas the leakage mode is dominant in the self- capacitance mode. While the coupling effect is mainly defined by the geometry and material distribution close to the electrodes, the root cause or modulation of the leakage effect may be far away from the electrode. In this paper we demonstrate that the leakage mode concept allows for simulation of 3D problems in 2D. This is useful in applications such as Electrical Capacitance Tomography or object classification as it allows simplifying the computational complexity while providing additional information compared to the classical 2D approach.
机译:在测量电极之间的互电容时,耦合和泄漏效应均会影响测量结果,而泄漏模式在自电容模式中则占主导地位。尽管耦合效应主要由靠近电极的几何形状和材料分布来定义,但泄漏效应的根本原因或调制可能离电极较远。在本文中,我们证明了泄漏模式的概念可以模拟2D中的3D问题。与传统的2D方法相比,这在简化电容计算的同时提供额外的信息,在诸如电容层析成像或对象分类之类的应用中很有用。

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