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Growth of GaAsBi/GaAs Multi Quantum Wells on (100) GaAs Substrates by Molecular Beam Epitaxy

机译:利用分子束外延在(100)GaAs衬底上生长GaAsBi / GaAs多量子阱

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Multi-quantum wells (MQWs) consisting of 3 or 3.5 pairs of nominally 8.8-nm-thick GaAs layers and 5.6-nmthick GaAs0.97Bi0.03 were grown by molecular beam epitaxy with varying the growth temperature of GaAs layers, TGaAs, and keeping the growth temperature of the GaAsBi layers at 350°C and their Bi compositional structure and optical properties were investigated. Analysis of x-ray diffraction spectra reveals that 67% of the total Bi atoms supplied during growth of a single GaAsBi layer were segregated on the growing surface and were incorporated into the successive GaAs layer at TGaAs = 350°C. The GaAs layers at TGaAs = 450 and 500°C contained 17% of the Bi atoms totally supplied and 50% of them were evaporated. Almost all Bi atoms segregated during growth of GaAsBi evaporated and were not incorporated into the GaAs layer at TGaAs = 550°C or higher. Photoluminescence (PL) spectra at 13 K shows all MQW samples have good optical quality and the MQW sample grown at TGaAs = 550°C shows the longest wavelength emission peak at 1116 nm which is 44 nm longer than the PL wavelength for the MQW grown at TGaAs = 350°C, even though the tremendous reduction of Bi incorporation into the GaAs layer grown at TGaAs = 550°C. The result strongly suggests that GaAsBi/GaAs has the type II band configuration. [DOI: 10.1380/ejssnt.2015.469]
机译:通过分子束外延生长由3或3.5对标称的8.8 nm厚的GaAs层和5.6 nm厚的GaAs0.97Bi0.03组成的多量子阱(MQW),并改变GaAs层,TGaAs的生长温度并保持研究了GaAsBi层在350℃下的生长温度及其Bi的组成结构和光学性质。 X射线衍射光谱分析表明,在单个GaAsBi层的生长过程中提供的总Bi原子中有67%被隔离在生长表面上,并在TGaAs = 350°C下掺入到连续的GaAs层中。在TGaAs = 450和500℃下的GaAs层包含全部提供的17%的Bi原子,并且蒸发了其中的50%。在GaAsBi的生长过程中,几乎所有的Bi原子都蒸发了,并且在TGaAs = 550°C或更高的温度下没有掺入GaAs层中。在13 K处的光致发光(PL)光谱显示所有MQW样品均具有良好的光学质量,并且在TGaAs = 550°C时生长的MQW样品在1116 nm处显示出最长的波长发射峰,该波长比在32°C下生长的MQW的PL波长长44 nm。即使在TGaAs = 550°C下生长的GaAs层中掺入的Bi大大减少,TGaAs = 350°C。该结果强烈表明GaAsBi / GaAs具有II型带构造。 [DOI:10.1380 / ejssnt.2015.469]

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