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Study on a Novel Sample Preparation Method for Organic Materials in Atom Probe Tomography

机译:原子探针层析成像中有机材料新样品制备方法的研究

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It is important to study the distribution of host and guest molecules in organic electroluminescence materials because their distribution dramatically affects the functionalities of these materials.In order to understand this distribution, a new analysis method should be developed to obtain sub-nanometer scale information.In this regard, we used Atom Probe Tomography (APT).APT is a three-dimensional analysis technique with sub-nanometer scale resolution and is frequently used in material science and engineering.There are many reports on the analysis of inorganic materials using APT analysis, however only a few studies report the analysis of organic materials because of difficulties in the sample preparation, measurements, and the three-dimensional reconstruction of organic materials.In this study, we focused on developing a new sample preparation method and suggested the new sample preparation method for the analysis of organic materials.This new preparation method needs only a small amount of organic materials for analysis.Moreover, it is very simple and combines electrolytic polishing with the dipping method.
机译:研究主体和客体分子在有机电致发光材料中的分布非常重要,因为它们的分布会极大地影响这些材料的功能性。为了理解这种分布,应该开发一种新的分析方法以获得亚纳米级的信息。在这方面,我们使用原子探针层析成像(APT)。APT是一种具有亚纳米尺度分辨率的三维分析技术,在材料科学和工程中经常使用。关于使用APT分析进行无机材料分析的报道很多,然而,由于样品制备,测量和有机材料三维重构的困难,仅有少数研究报告了有机材料的分析。在本研究中,我们着重于开发一种新的样品制备方法并提出了新的样品制备方法。分析有机材料的方法。这种新的制备方法仅需少量此外,它非常简单,并且将电解抛光与浸渍方法结合在一起。

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