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A novel controllable carrier-injection mechanism in high voltage diode for reducing switching loss

机译:一种新型可控的高压二极管载流子注入机制,以减少开关损耗

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摘要

References(8) A controllable injection diode (CID) is proposed for reducing switching loss and a novel controllable carrier-injection mechanism (CCIM) is investigated in the new device. The CCIM reveals that due to the limit carrier lifetime, the carrier-injection can be controlled in one narrow-pulse time. Based on the CCIM, the CID takes advantage of a PiN diode and a junction field-effect transistor (JFET) for modulating the forward voltage drop. The simulation results show that the forward voltage drop can be modulated to 0.54 V at minimum by the carrier-injection enhancement at 45 A/cm2. On the other hand, the JFET weakens carrier-storage effect in the i-layer and the reverse recovery time of the CID is about 0.27 μs at rectifying 50 kHz, which is sufficiently faster than 1.1 μs of the conventional diode. Therefore, the switch loss of the CID can be decreased in a DC-DC buck converter.
机译:参考文献(8)提出了一种可控注入二极管(CID)来降低开关损耗,并在新器件中研究了一种新颖的可控载流子注入机制(CCIM)。 CCIM显示,由于载流子寿命有限,可以在一个窄脉冲时间内控制载流子注入。 CID基于CCIM,利用PiN二极管和结型场效应晶体管(JFET)来调制正向压降。仿真结果表明,通过以45 A / cm2的速度注入载流子,可以将正向压降最小调制为0.54V。另一方面,JFET减弱了i层中的载流子存储效应,并且在整流50 kHz时CID的反向恢复时间约为0.27μs,这比常规二极管的1.1μs足够快。因此,可以在DC-DC降压转换器中减小CID的开关损耗。

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