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Electromagnetic properties of bismuth oxide thin film deposited onglass and alumina

机译:玻璃和氧化铝上沉积的氧化铋薄膜的电磁性能

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The bismuth oxide thin films were prepared by thermal oxidation (in air) of vacuum evaporated bismuth thin film on glass and alumina. Surface morphology shows granular structure on glass and triangular shaped grains on alumina substrates. The effect of bismuth oxide thin film overlay of different thickness on Ag thick film microstrip rectangular patch antenna was investigated in the X- band (8-12GHz). The change in the resonance frequency, amplitude, band width, quality factor and input impedance of the antenna were studied. Using the resonance frequency the permittivity and conductivity of bismuth oxide thin film was also measured. Thickness and oxidation temperature of Bi2O3 thin film overlay dependent changes in the patch antenna characteristics was obtained. The input impedance increases due to the overlay. The dielectric constant of bismuth oxide thin film on both substrate calculated from shift in resonance frequency shows thickness and oxidation temperature dependent values. The microwave permittivity and conductivity of Bi2O3 thin film on glass as well as alumina substrate have been reported for the first time using overlay on thick film patch antenna. Thickness of overlay dependent tuning of the antenna has been achieved
机译:通过在玻璃和氧化铝上对真空蒸发的铋薄膜进行热氧化(在空气中)来制备氧化铋薄膜。表面形态显示玻璃上的颗粒结构和氧化铝基材上的三角形晶粒。在X波段(8-12GHz)上研究了不同厚度的氧化铋薄膜覆盖层对Ag厚膜微带矩形贴片天线的影响。研究了天线的谐振频率,幅度,带宽,品质因数和输入阻抗的变化。使用共振频率,还测量了氧化铋薄膜的介电常数和电导率。获得了Bi2O3薄膜覆盖层厚度和氧化温度随贴片天线特性的变化而变化的信息。输入阻抗由于覆盖而增加。由共振频率的偏移计算出的两个基板上的氧化铋薄膜的介电常数表示厚度和氧化温度相关值。首次报道了在厚膜贴片天线上使用Bi2O3薄膜在玻璃以及氧化铝基板上的微波介电常数和电导率。已经实现了覆盖层厚度的天线调谐

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