XRD studies of Chemically Deposited Bi2S3 Thin Films

摘要

Bi2S3 thin films have been prepared by chemical bath deposition method using Bismuth nitrate and Sodium thiosulphate. Films were deposited onto well cleaned glass substrates with different deposition time periods. The Xray diffraction pattern revealed that bismuth sulphide thin films exhibit orthorhombic structure. The structural parameters (grain size 94-358Å, dislocation density 0.7789-11.22X1015 l/m2 and strain (ε) 3.85-1.027X10-3) have been calculated