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首页> 外文期刊>American journal of applied sciences >DETERMINING OPTICAL CONSTANTS OF SELENIUM THIN FILMS USING THE ENVELOPE METHOD | Science Publications
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DETERMINING OPTICAL CONSTANTS OF SELENIUM THIN FILMS USING THE ENVELOPE METHOD | Science Publications

机译:包络法测定硒薄膜的光学常数|查阅全文需要付费。科学出版物

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> Two Selenium thin films were deposited on glass substrates using thermal evaporation technique. The optical constants (refractive index, absorption coefficient and extinction coefficient and energy gap) were calculated using the Transmittance (T) spectrums of the films in the spectral range of 500-900 nm. The envelope method was used to determine optical constants. The calculated refractive index was found to be in the range of 2.60 to 2.85 and the Energy gap (Eg) was found to be 1.8 eV which are in agreement with other studies made using other procedures. The films were found to be amorphous according to the results obtained by XRD technique. This method can be used to have a good results for many tranparent thin films with more mathematical tools.
机译: >使用热蒸发技术在玻璃基板上沉积了两个硒薄膜。使用膜在500-900nm的光谱范围内的透射率(T)光谱来计算光学常数(折射率,吸收系数,消光系数和能隙)。包络法用于确定光学常数。发现计算出的折射率在2.60至2.85的范围内,并且发现能隙(E )为1.8eV,这与使用其他程序进行的其他研究一致。根据通过XRD技术获得的结果,发现膜是非晶的。使用许多数学工具,该方法可以对许多透明薄膜具有良好的效果。

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