The Determination of the Optical Constants of Amorphous Thin Films of Selenium and Arsenic Triselenide from Infra-Red Reflectivity Spectra

摘要

The reflectivity spectra of thin films of amorphous arsenic triselenide and selenium have been obtained. The films are deposited on aluminum substrates and have a range of thickness from 2 to 50 microns. The reflectivity spectra of these samples cover the region from 650 to 40 wavenumbers (15 to 250 microns). (Author)