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Development and Evaluation of a Particle Deposition Measurement Method Based on a CCD Imaging Chip

机译:基于CCD成像芯片的颗粒沉积测量方法的开发与评估

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Particle deposition on indoor surfaces has lately received great attention due to increasing concern about the effects of particle exposure on human health. In this study, we developed an easy and low-cost method of measuring the deposition amounts of different-sized particles and evaluated it through particle concentration measurement and theory calculation. First, a clean charge-coupled device (CCD) chip was exposed to air in order to receive the deposition of airborne particles. After sedimentation, images generated by the CCD of the deposited particles were analyzed, and the quantity of particles in each size range (> 2 μm) was identified based on the unique pixel sizes. Using a particle counter and a dust monitor, we also measured the concentrations of airborne particles with different sizes near the chip during sedimentation and compared them with the numbers of settled particles. The results show that the particle deposition can be quantified with this method and that a positive correlation exists between the deposition amounts and the particle number concentrations.
机译:由于越来越关注颗粒暴露对人体健康的影响,近来室内表面的颗粒沉积受到了广泛关注。在这项研究中,我们开发了一种简单而低成本的方法来测量不同尺寸颗粒的沉积量,并通过颗粒浓度测量和理论计算对其进行了评估。首先,将清洁的电荷耦合器件(CCD)芯片暴露于空气中,以接收空气中颗粒的沉积。沉积后,分析由CCD生成的沉积颗粒的图像,并根据独特的像素大小确定每个尺寸范围(> 2μm)中的颗粒数量。我们还使用粒子计数器和灰尘监测器,在沉淀期间测量了切屑附近​​不同尺寸的空气传播颗粒的浓度,并将其与沉降颗粒的数量进行了比较。结果表明,该方法可以定量颗粒的沉积,并且沉积量与颗粒数浓度之间存在正相关。

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