...
首页> 外文期刊>Nature reviews Cancer >Development and Evaluation of a Particle Deposition Measurement Method Based on a CCD Imaging Chip
【24h】

Development and Evaluation of a Particle Deposition Measurement Method Based on a CCD Imaging Chip

机译:基于CCD成像芯片的粒子沉积测量方法的开发与评价

获取原文
获取原文并翻译 | 示例
           

摘要

Particle deposition on indoor surfaces has lately received great attention due to increasing concern about the effects of particle exposure on human health. In this study, we developed an easy and low-cost method of measuring the deposition amounts of different-sized particles and evaluated it through particle concentration measurement and theory calculation. First, a clean charge-coupled device (CCD) chip was exposed to air in order to receive the deposition of airborne particles. After sedimentation, images generated by the CCD of the deposited particles were analyzed, and the quantity of particles in each size range (> 2 mu m) was identified based on the unique pixel sizes. Using a particle counter and a dust monitor, we also measured the concentrations of airborne particles with different sizes near the chip during sedimentation and compared them with the numbers of settled particles. The results show that the particle deposition can be quantified with this method and that a positive correlation exists between the deposition amounts and the particle number concentrations.
机译:由于粒子暴露对人体健康的影响,室内表面上的粒子沉积最近受到了极大的关注。在这项研究中,我们开发了一种简单而低成本的方法,可测量不同尺寸的颗粒的沉积量,并通过颗粒浓度测量和理论计算评价。首先,将清洁电荷耦合器件(CCD)芯片暴露于空气中以便接收空气传播颗粒的沉积。在沉淀后,分析由沉积颗粒的CCD产生的图像,并且基于独特的像素尺寸鉴定每个尺寸范围(>2μm)中的颗粒量。使用粒子计数器和粉尘监测器,我们还测量了在沉降期间在芯片附近的不同尺寸的空气颗粒的浓度,并将它们与沉降颗粒的数量进行比较。结果表明,颗粒沉积可以用该方法量化,并且在沉积量和颗粒数浓度之间存在正相关。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号