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Effect of Pr6O11 doping in electrical and microstructural properties of SnO2-based varistors

机译:Pr6O11掺杂对SnO2基压敏电阻电学和微结构性能的影响

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The influence of the dopant Pr6O11 was investigated with regard to the electrical and microstructural properties of the system (98.95-x)%SnO2.1.0%CoO.0.05%Ta2O5.x%Pr6O11, where x = 0.05%, 0.10%, 0.30% and 0.50% in mol. Pr6O11 doping modifies the electrical behavior of the ceramics. The electrical parameters were: α = 8.0, EB = 319 V cm-1 and Vb = 0.66 V barrier-1 for the system without Pr6O11 and α = 17.0, EB = 853 V cm-1 and Vb = 1.15 V barrier-1 with the addition of 0.10% in mol Pr6O11. The system with 0.05% in mol Pr6O11 had the same non-linearity coefficient α as the system with 0.10% in mol. However, breakdown electrical field and voltage per barrier rates were lower (EB = 708 V cm-1 and Vb = 0.98 V barrier-1). The low rates in the breakdown electrical field enabled the varistor systems under study to be used in protection systems for low-voltage energy grids. In the case of Pr6O11 concentrations above 0.10% in mol, the presence of the dopant became deleterious to the varistor’s electrical characteristics. This effect was due to an increase in praseodymium stannate (Pr2Sn2O7) secondary phase. The crystalline phase coupled to the cassiterite (SnO2) phase was found with XRD and SEM/EDS and quantified by Rietveld’s refining method.
机译:研究了掺杂剂Pr6O11对系统的电学和微结构特性的影响(98.95-x)%SnO2.1.0%CoO.0.05%Ta2O5.x%Pr6O11,其中x = 0.05%,0.10%,0.30%和0.50%(摩尔)。 Pr6O11掺杂会改变陶瓷的电性能。电气参数为:对于不带Pr6O11的系统,α= 8.0,EB = 319 V cm-1和Vb = 0.66 V barrier-1,对于α= 17.0,EB = 853 V cm-1和Vb = 1.15 V barrier-1加入0.10%(摩尔)的Pr6O11。 Pr6O11摩尔含量为0.05%的系统与0.10%摩尔含量的系统具有相同的非线性系数α。但是,击穿电场和每个势垒速率的电压更低(EB = 708 V cm-1和Vb = 0.98 V势垒-1)。击穿电场中的低速率使所研究的压敏电阻系统可用于低压电网的保护系统。在Pr6O11的摩尔浓度高于0.10%的情况下,掺杂剂的存在对压敏电阻的电学特性有害。该作用归因于锡酸((Pr2Sn2O7)第二相的增加。通过XRD和SEM / EDS发现了与锡石(SnO2)相耦合的结晶相,并通过Rietveld的精炼方法对其进行了定量。

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