首页> 外文会议>Annual Meeting on Testing and Evaluation of Inorganic Materials >Effect of Pr_6O_(11) Doping on the Microstructural and Electrical Properties of ZnO-Pr_6O_(11)-Co_3O_4-Cr_2O_3-SnO_2 Varistors
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Effect of Pr_6O_(11) Doping on the Microstructural and Electrical Properties of ZnO-Pr_6O_(11)-Co_3O_4-Cr_2O_3-SnO_2 Varistors

机译:PR_6O_(11)掺杂对ZnO-PR_6O_(11)-CO_3O_4-CR_2O_3-SNO_2变阻器的微结构和电性能的影响

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ZnO-Pr_6O_(11)-Co_3O_4-Cr_2O_3-SnO_2 varistors with different doping levels of Pr_6O_(11) (0.25-2 mol%) were prepared at 1300°C with conventional ceramic processing, and the effect of Pr_6O_(11) doping on the microstructure and electrical properties of the varistor materials were investigated. The results indicated that the doped Pr_6O_(11) basically existed at the boundary of ZnO grains in the varistor ceramics, and SnO_2 might enter into the lattice of ZnO grains or precipitate in reaction with Pr_6O_(11) into Pr_2Sn_2O_7 at the gain boundaries particularly where there were three or more ZnO grains. The analysis of scanning electron microscopy further revealed that Pr_6O_(11) doping would inhibit the growth of ZnO grains, resulting in decreasing ZnO grain size with increasing doping level of Pr_6O_(11). The measured electric-field/current-density characteristics of the samples showed that the varistor voltage increased with increasing doping level of Pr_6O_(11) when the doping level was no more than 1.5 mol%, and the nonlinear coefficient of the varistors increased with increasing doping level of Pr_6O_(11) up to no more than 1.0 mol% in the varistors, respectively.
机译:ZnO类Pr_6O_(11)-Co_3O_4-Cr_2O_3-SnO_2变阻器与Pr_6O_(11)(0.25-2摩尔%)在1300℃下用传统的陶瓷加工,制备的不同的掺杂水平,以及Pr_6O_掺杂对的效果(11)变阻器材料的微观结构和电特性进行了调查。结果表明,在掺杂Pr_6O_(11)在ZnO晶粒的在可变电阻陶瓷的边界基本上存在,SnO_2可能在反应中与Pr_6O_(11)在增益边界进入ZnO晶粒或析出物的晶格成Pr_2Sn_2O_7特别是其中有三个或更多的ZnO粒子。扫描电子显微镜的分析进一步揭示了Pr_6O_(11)的掺杂将抑制ZnO晶粒的生长,从而导致与Pr_6O_的增加掺杂水平(11)的ZnO减小晶粒尺寸。样品的测量电场/电流密度特性表明,非线性电阻电压随Pr_6O_的掺杂水平(11)时增加的掺杂水平是不超过1.5摩尔%,的非线性系数变阻器用的增加而增加分别掺杂(11)Pr_6O_的水平提高到不超过1.0摩尔%,在压敏电阻,。

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