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Antireflection Coatings for Strongly Curved Glass Lenses by Atomic Layer Deposition

机译:原子层沉积技术在强弯曲玻璃镜片的减反射膜上的应用

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Antireflection (AR) coatings are indispensable in numerous optical applications and are increasingly demanded on highly curved optical components. In this work, optical thin films of SiO2, Al2O3, TiO2 and Ta2O5 were prepared by atomic layer deposition (ALD), which is based on self-limiting surface reactions leading to a uniform film thickness on arbitrarily shaped surfaces. Al2O3/TiO2/SiO2 and Al2O3/Ta2O5/SiO2 AR coatings were successfully applied in the 400–750 nm and 400–700 nm spectral range, respectively. Less than 0.6% reflectance with an average of 0.3% has been measured on a fused silica hemispherical (half-ball) lens with 4 mm diameter along the entire lens surface at 0° angle of incidence. The reflectance on a large B270 aspherical lens with height of 25 mm and diameter of 50 mm decreased to less than 1% with an average reflectance < 0.3%. The results demonstrate that ALD is a promising technology for deposition of uniform optical layers on strongly curved lenses without complex in situ thickness monitoring.
机译:抗反射(AR)涂层在许多光学应用中都是必不可少的,并且对高度弯曲的光学组件的要求也越来越高。在这项工作中,通过原子层沉积(ALD)制备了SiO2,Al2O3,TiO2和Ta2O5的光学薄膜,这是基于自限表面反应而导致在任意形状的表面上均匀的膜厚。 Al2O3 / TiO2 / SiO2和Al2O3 / Ta2O5 / SiO2增透膜分别在400-750 nm和400-700 nm光谱范围内成功应用。在直径为4 mm的熔融石英半球形(半球)透镜上,沿整个透镜表面以0°入射角测量的反射率均小于0.6%,平均为0.3%。在高度为25 mm,直径为50 mm的大型B270非球面透镜上的反射率降低至小于1%,平均反射率<0.3%。结果表明,ALD是一种有前途的技术,可用于在不需进行复杂的原位厚度监控的情况下在强弯透镜上沉积均匀的光学层。

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