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首页> 外文期刊>Chalcogenide Letters >SURFACE SELF-ORDERING IN OBLIQUELY DEPOSITED As2S3FILMS
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SURFACE SELF-ORDERING IN OBLIQUELY DEPOSITED As2S3FILMS

机译:倾斜沉积的As2S3薄膜中的表面自定序

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The surface morphology of 250-3000 nm thick As2S3films vacuum deposited within 70-80° scale of vapor incidence angles is studied by AFM. It is observed that the surface relief of obliquely deposited films (ODF) shows quasi-regular grating-like structure, with the spatial frequency of quasi-gratings being in the 500-6000 mm-1range, and relief depth of up to 60 nm. The influence of the film thickness and the type of the substrate on the surface morphology is demonstrated. The most probable explanation for the observed surface effect is the near-surface stress that plays significant role in the self-organized ordering of nanostructures at the mesoscopic length scales (from several nanometers to hundreds of nanometers).
机译:通过原子力显微镜研究了在气相入射角为70-80°范围内真空沉积的250-3000 nm厚的As2S3薄膜的表面形貌。观察到倾斜沉积膜(ODF)的表面浮雕呈准规则的光栅状结构,准光栅的空间频率在500-6000 mm-1范围内,浮雕深度可达60 nm。证明了膜厚度和基底类型对表面形态的影响。对于观察到的表面效应,最可能的解释是近表面应力在介观长度尺度(从几纳米到几百纳米)中对纳米结构的自组织有序化起着重要作用。

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