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首页> 外文期刊>Chalcogenide Letters >ROOM TEMPERATURE FERROMAGNETIC BEHAVIOUR OF INDIUMDOPED SnO2 DILUTE MAGNETIC SEMICONDUCTOR NANOCRYSTALLINE THIN FILMS
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ROOM TEMPERATURE FERROMAGNETIC BEHAVIOUR OF INDIUMDOPED SnO2 DILUTE MAGNETIC SEMICONDUCTOR NANOCRYSTALLINE THIN FILMS

机译:掺杂SnO2稀释磁半导体纳米薄膜的室温铁磁行为。

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摘要

Pure and Indium (In) doped SnO2 nanocrystalline thin films have been fabricated using sol-gel technique. The effect of In-doping on structural, optical and magnetic properties has been studied. Scanning electron microscopy (SEM) study reveals that the grains of pure and doped SnO2 possesses spherical symmetry. X-ray diffraction (XRD) study reveals that pure and In-doped SnO2 thin films possess rutile structure having tetragonal phase. UV-visible study suggests that with In-doping in SnO2, the value of the band gap first increases (upto 5% In-concentration) but further increase in concentration of In to 25% leads to decrease in band gap. It has been found from the room temperature magnetic study that pure and In-doped SnO2 thin films show ferromagnetic behaviour, however with 5% In-doping saturation magnetization value increased. The observed ferromagnetic behaviour may be due to the defects and oxygen vacancies.
机译:已经使用溶胶-凝胶技术制备了纯的和铟(In)掺杂的SnO2纳米晶体薄膜。研究了In掺杂对结构,光学和磁性能的影响。扫描电子显微镜(SEM)研究表明,纯净和掺杂的SnO2晶粒具有球形对称性。 X射线衍射(XRD)研究表明,纯In掺杂的SnO2薄膜具有金红石结构,具有四方相。紫外可见研究表明,在SnO2中进行In掺杂后,带隙的值首先增加(In浓度最高达到5%),但是In浓度进一步提高到25%会导致带隙减小。从室温磁研究可以发现,纯In掺杂的SnO2薄膜显示出铁磁行为,但是In掺杂的饱和磁化强度增加了5%。观察到的铁磁行为可能是由于缺陷和氧空位所致。

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