CHARACTERIZATION OF MICROWAVE ASSISTED CHEMICALLY DEPOSITED SnS THIN FILM

摘要

Tin sulfide thin films were prepared on glass substrate by microwave assisted chemical solution deposition technique. The deposition was carried out in the range of microwave power output from 160 to 720 watts. X-ray diffraction pattern, surface micrograph and visible - near infra red spectra of the film has been analyzed and reported in this paper