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Observation of Meier-Neldel rule in a-Se60Te20Ge20 thin films in presence of light

机译:有光存在下a-Se60Te20Ge20薄膜中Meier-Neldel规则的观察

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In general, in case of semiconductors, conductivity (σ ) varies exponentially with temperature (T), i.e., σ = σ0exp [-. E/k T]. In most of the materials, σ0does not depend on . E. However, in many amorphous and liquid semiconductors and many other class of materials, σ0is found to increase exponentially with . E. This is called Meyer- Neldel rule. This rule is generally verified by selecting different compositions of different . E in a given class of materials. This opens a possibility of change in various other physical properties apart from . E. In the present paper, we report on the observation of Meyer- Neldel rule where . E is varied by varying the intensity of light while measuring the photoconductivity in amorphous thin films of Se60Te20Ge20instead of changing composition of the glassy system. The observation of Meyer-Neldel rule in the present case indicates that this rule is more general and does not fail due to change in density or distribution of defect states or any other physical property due to change in composition
机译:通常,在半导体的情况下,电导率(σ)随温度(T)呈指数变化,即σ=σ0exp[-。 E / k T]。在大多数材料中,σ0不依赖。 E.但是,在许多非晶态和液态半导体以及许多其他类型的材料中,发现σ0随指数增长。 E.这称为Meyer-Neldel规则。通常通过选择不同组成的不同来验证该规则。 E在给定类别的材料中。这开辟了改变各种其他物理性质的可能性。 E.在本文中,我们报告了对Meyer-Neldel规则的观察,其中。通过在测量Se60Te20Ge20非晶薄膜中的光导率的同时改变光强度来改变E,而不是改变玻璃态系统的组成。在当前情况下对Meyer-Neldel规则的观察表明,该规则更为通用,不会因缺陷状态的密度或缺陷状态的变化或由于成分变化而引起的任何其他物理性质而失败

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