首页> 外文期刊>IEEE Transactions on Computers >Synchro-tokens: a deterministic GALS methodology for chip-level debug and test
【24h】

Synchro-tokens: a deterministic GALS methodology for chip-level debug and test

机译:同步令牌:用于芯片级调试和测试的确定性GALS方法

获取原文
获取原文并翻译 | 示例

摘要

This paper describes a novel deterministic globally-asynchronous locally-synchronous (GALS) methodology called "synchro-tokens". Wrappers around the synchronous blocks keep the system globally asynchronous while ensuring that each transition, although arriving at a nondeterministic time, is sensed by the synchronous block during a deterministic cycle of the local clock. This determinism facilitates debug and test methodologies, such as the use of stored-pattern testers, which are effective only when the system behavior is predictable and repeatable. Applications of synchro-tokens to GALS systems with two or more synchronous blocks and one or more asynchronous data channels are shown. Synchro-tokens supports both pipelined and unpipelined channels and a variety of clock generation methodologies. Novel schematic level designs of the wrapper components in a 180-nm technology are used to compare the performance of several different deterministic GALS design styles.
机译:本文介绍了一种新颖的确定性全局异步本地同步(GALS)方法,称为“同步令牌”。同步块周围的包装器使系统保持全局异步,同时确保每次转换(尽管到达不确定时间)在本地时钟的确定性周期内都被同步块感知到。这种确定性有助于调试和测试方法,例如使用存储模式测试器,这些方法仅在系统行为可预测和可重复时才有效。显示了将同步令牌应用于具有两个或多个同步块和一个或多个异步数据通道的GALS系统。同步令牌支持流水线和非流水线通道以及多种时钟生成方法。 180纳米技术中的包装器组件的新颖原理图级设计用于比较几种不同的确定性GALS设计样式的性能。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号