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Write Mode Aware Loop Tiling for High Performance Low Power Volatile PCM in Embedded Systems

机译:适用于嵌入式系统中高性能,低功耗易失性PCM的写模式感知环路平铺

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摘要

Architecting PCM, especially MLC PCM, as main memory for MCUs is a promising technique to replace conventional DRAM deployment. However, PCM/MLC PCM suffers from long write latency and large write energy. Recent work has proposed a compiler directed dual-write (CDDW) scheme to combat the drawbacks of PCM by adopting fast or slow mode for different write operations. For large-scale loops, we observe that write instances' lifetime is very long and can only be written by the expensive slow mode. This paper proposes a write mode aware loop tiling approach to effectively reduce the lifetime of write instances and maximize the number of efficient fast writes in loops. The experimental results show that the proposed approach improves performance by 50.8 percent and reduces dynamic energy by 32.0 percent across a set of benchmarks compared to the CDDW approach on average.
机译:将PCM(尤其是MLC PCM)设计为MCU的主存储器是一种有前途的技术,可以代替传统的DRAM部署。但是,PCM / MLC PCM具有较长的写入延迟和较大的写入能量。最近的工作提出了一种针对编译器的双写(CDDW)方案,通过对不同的写操作采用快速或慢速模式来克服PCM的缺点。对于大规模循环,我们观察到写入实例的生存期非常长,并且只能通过昂贵的慢速模式来写入。本文提出了一种写模式感知循环切片方法,以有效地减少写实例的寿命,并最大程度地提高循环中有效快速写操作的次数。实验结果表明,与CDDW方法相比,该方法在一组基准测试中的性能提高了50.8%,动态能量降低了32.0%。

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