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Refresh-Aware Write Recovery Memory Controller

机译:刷新感知的写恢复存储器控制器

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摘要

Current computer systems require large memory capacities to manage the tremendous volume of datasets. A DRAM cell consists of a transistor and a capacitor, and their size has a direct impact on DRAM density. While technology scaling can provide higher density, this benefit comes at the expense of low drivability, due to the increase in series resistance of the smaller transistor, which slows the process of restoring the charge in cells. DRAM operations require recovery processes due to the destructive nature of DRAM cells. Among such operations, the write recovery process has the most difficulty in meeting the timing constraints. In this paper, we explore an intrinsic mechanism in the DRAM write operation, and find a relation between restoration and retention times. Based on our observation, we propose a practical mechanism, Relaxed Refresh with Compensated Write Recovery (RRCW), which efficiently mitigates refresh overheads by providing longer restoration periods. Furthermore, to minimize the penalty of the longer restoration, we also introduce another mechanism, Refresh-Aware Write Recovery (RAWR), which appropriately curtails longer recovery time according to the waiting time until being refreshed. Lastly, we introduce a scheduling policy to efficiently utilize RAWR. Evaluations show that the benefits of our mechanisms increase as memory intensity increases.
机译:当前的计算机系统需要大的存储容量来管理海量的数据集。 DRAM单元由晶体管和电容器组成,其大小直接影响DRAM的密度。虽然技术缩放可以提供更高的密度,但由于较小的晶体管的串联电阻增加,因此降低了可驱动性,但这样做的好处是,这会减慢恢复单元中电荷的速度。由于DRAM单元的破坏性,DRAM操作需要恢复过程。在这些操作中,写恢复过程最难以满足时序约束。在本文中,我们探索了DRAM写操作的内在机制,并找到了恢复时间与保留时间之间的关系。根据我们的观察,我们提出了一种实用的机制,即通过补偿式写恢复(RRCW)进行的放松刷新,该机制通过提供更长的恢复时间有效地减轻了刷新开销。此外,为了最小化较长恢复的代价,我们还引入了另一种机制,即刷新感知的写恢复(RAWR),该机制根据等待刷新之前的等待时间适当地减少了较长的恢复时间。最后,我们介绍了一种调度策略以有效利用RAWR。评估表明,我们的机制的好处随着记忆强度的增加而增加。

著录项

  • 来源
    《IEEE Transactions on Computers》 |2017年第4期|688-701|共14页
  • 作者单位

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

    DRAM Development Division, SK hynix, Icheon, Gyeonggi-do, South Korea;

    DRAM Development Division, SK hynix, Icheon, Gyeonggi-do, South Korea;

    Department of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Random access memory; Capacitors; Transistors; Temperature sensors; Timing; Radiation detectors; Temperature distribution;

    机译:随机存取存储器;电容器;晶体管;温度传感器;定时;辐射探测器;温度分布;

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