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VRSync: Characterizing and Eliminating Synchronization-Induced Voltage Emergencies in Many-core Processors*

机译:VRSync:表征和消除多核处理器中由同步引起的电压紧急情况*

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摘要

Power consumption is a primary concern for microprocessor designers. Lowering the supply voltage of processors is one of the most effective techniques for improving their energy efficiency. Unfortunately, low-voltage operation faces multiple challenges going forward. One such challenge is increased sensitivity to voltage fluctuations, which can trigger so-called "voltage emergencies" that can lead to errors. These fluctuations are caused by abrupt changes in power demand, triggered by processor activity variation as a function of workload.This paper examines the effects of voltage fluctuations on future many-core processors. With the increase in the number of cores in a chip, the effects of chip-wide activity fluctuation - such as that caused by global synchronization in multithreaded applications - overshadow the effects of co re-lev el workload variability. Starting from this observation, we developed VRSync, a novel synchronization methodology that uses emergency-aw are scheduling policies that reduce the slope of load fluctuations, eliminating emergencies. We show that VRSync is very effective at eliminating emergencies, allowing voltage guardbands to be significantly lowered, which reduces energy consumption by an average of 33%.
机译:功耗是微处理器设计人员的主要关注点。降低处理器的电源电压是提高其能效的最有效技术之一。不幸的是,低压操作面临着多重挑战。这样的挑战之一是对电压波动的敏感性增加,这会触发可能导致错误的所谓“电压紧急情况”。这些波动是由功耗需求的突然变化引起的,而功耗的突然变化是由处理器活动随工作负荷的变化而触发的。本文研究了电压波动对未来多核处理器的影响。随着芯片中内核数量的增加,芯片范围活动波动的影响(如多线程应用程序中的全局同步所引起的波动)使共同相关的工作负载可变性的影响黯然失色。从这一观察开始,我们开发了VRSync,这是一种新颖的同步方法,该方法使用紧急警报调度策略,可减少负载波动的斜率,消除紧急情况。我们证明,VRSync在消除紧急情况方面非常有效,可以显着降低电压保护带,从而平均降低了33%的能耗。

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  • 来源
    《Computer architecture news》 |2012年第3期|p.249-260|共12页
  • 作者单位

    Department of Computer Science and Engineering, The Ohio State University;

    Department of Computer Science and Engineering, The Ohio State University;

    Department of Computer Science and Engineering, The Ohio State University;

    Department of Computer Science and Engineering, The Ohio State University;

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