机译:非导电膜的热力学性能对40-
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Doosan Corp Electromat BG, Yongin 16858, South Korea;
Doosan Corp Electromat BG, Yongin 16858, South Korea;
Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Daejeon 34141, South Korea;
Coefficient of thermal expansion (CTE); Cu/Sn-Ag microbump; glass transition temperature; modulus; nonconductive films (NCFs); through-silicon via (TSV);
机译:高灵敏度
机译:加权-
机译:制作15-
机译:SnAg焊点形态对40 µm细间距Cu柱/ SnAg微凸点互连的热循环可靠性的影响
机译:混合