An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials

摘要

PurposeThe principle of microwave characterization of dielectric materials using open-ended coaxial line probe is to link the dielectric properties of the sample under test to the measurements of the probe admittance (Y(f) = G(f)+ jB(f )). The purpose of this paper is to develop an alternative inversion tool able to predict the evolution of the complex permittivity (epsilon = epsilon - j epsilon) on a broad band frequency (f from 1 MHz to 1.8 GHz).