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Design optimisation procedure for digital mismatch compensation in latch comparators

机译:锁存比较器中数字失配补偿的设计优化程序

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Digital calibration schemes generally allow for high-speed operation and reduced power consumption at the price of lower accuracy compared with their analogue counterparts. However, in dynamic comparators, when exceeding 4 or 5 bits, any resolution increase will be progressively traded against the circuit parameters. This study presents a three-step design procedure to optimise the comparator performance for a givenN. First, a new configuration of the latch comparator has allowed optimising the comparison speed in terms ofN. Second, the calibration scheme has been reduced to a simple digital sequencer to perform a progressive capacitive offset trimming. Third, the sequencer automatic increment has been programmed to stop at optimal operation to achieve the best calibration accuracy. The proposed method has then been applied to design a latch comparator with 7 bit calibration control in a commercially available 0.18 μm complementary metal-oxide-semiconductor technology. Post-layout statistical simulations have shown that the circuit can achieve up to 5.9 bit calibration resolution without altering the comparator performances.
机译:与模拟同类产品相比,数字校准方案通常以较低的精度为代价,允许高速运行并降低功耗。但是,在动态比较器中,当超过4位或5位时,任何分辨率的提高都将与电路参数进行逐步权衡。这项研究提出了一个三步设计过程,以针对给定的 n N。首先,锁存比较器的新配置允许根据 n N。其次,将校准方案简化为简单的数字定序器,以执行渐进式电容偏移微调。第三,定序器自动递增已编程为在最佳操作时停止,以实现最佳校准精度。然后,将所提出的方法应用于可商购的0.18μm互补金属氧化物半导体技术中的具有7位校准控制的锁存比较器。布局后的统计仿真表明,该电路可以实现高达5.9位的校准分辨率,而不会改变比较器的性能。

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