首页> 外文期刊>Circuit World >Joints realized by sintering of pressureless Ag paste
【24h】

Joints realized by sintering of pressureless Ag paste

机译:通过烧结无压银浆实现的接头

获取原文
获取原文并翻译 | 示例
       

摘要

PurposeThe purpose of this paper was to investigate an influence of a low temperature pressureless sintering process of silver paste on the quality of sintered joints.Design/methodology/approachThe authors analyzed various curing conditions of the paste during its sintering process: 175°C/90 min, 200°C/60 min, 250°C/30 min, 250°C/60 min, 350°C/30 min and 350°C/60 min. They analyzed an influence of the surface plating applied on a ceramic substrate/layer (Cu, Ag, AgPt and Au thick film) on the joints quality. The authors analyzed microstructure and electrical resistance of the joints. They evaluated these properties from the point of view of thermal aging process and changing resistance, after a constant current loading of the sintered joints.FindingsThe nanoscale pressureless silver paste can be applied for replacing a pressure-assisted micro-sized silver paste. It was found that the quality of the metal plating applied on the ceramic substrate/layer has a significant impact on the quality of the sintered joints. Copper and AgPt plating have better impact on quality of sintered joints in compare with Ag plating.Originality/valueThis investigation of the quality of the pressureless sintered joints at the silver-silver interface reveals an evident cracking immediately after the silver paste curing. Rapid sintering process typical for silver-based films on the substrate is because of the inter-diffusion between the micro and nanoparticles of silver at interfacial interface.
机译:目的本文旨在研究银浆的低温无压烧结工艺对烧结接头质量的影响。设计/方法/方法作者分析了银浆在烧结过程中的各种固化条件:175°C / 90分钟,200°C / 60分钟,250°C / 30分钟,250°C / 60分钟,350°C / 30分钟和350°C / 60分钟。他们分析了施加在陶瓷基板/层(Cu,Ag,AgPt和Au厚膜)上的表面镀层对接缝质量的影响。作者分析了接头的微观结构和电阻。他们从烧结接头的恒定电流负载后的热老化过程和电阻变化的角度评估了这些性能。发现纳米级无压银浆可用于替代压力辅助的微米级银浆。已经发现,施加在陶瓷衬底/层上的金属镀层的质量对烧结接头的质量有重大影响。铜/ AgPt镀层比Ag镀层对烧结接头的质量有更好的影响。原始数据/值这项对银-银界面无压烧结接头的质量的调查显示,银浆固化后立即出现明显的开裂。对于基底上的银基薄膜而言,典型的快速烧结过程是由于银的微颗粒和纳米颗粒在界面处相互扩散。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号