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Height measurement of DNA molecules with lift mode AFM

机译:使用提升模式AFM测量DNA分子的高度

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The height of double-stranded DNA (dsDNA) is measured by lift mode AFM combined with conventional tapping mode AFM. While the tip scan height is raised step by step, the tip pressure on sample is decreased gradually. As a result, the deformation of the DNA strands decreases, and the height of double-stranded DNA (dsDNA) molecule can be deduced by the tip lift height. The measured height of dsDNA is 1.5 ± 0.2 nm in lift mode, but only 0.8 ± 0.2 nm in conventional tapping mode. This demonstrates thatthe tip pressure is a key factor in soft sample height measurement resulting in artificating lower values via conventional tapping mode.
机译:双链DNA(dsDNA)的高度是通过提升模式AFM与常规攻丝模式AFM结合进行测量的。当针尖扫描高度逐步提高时,样品上的针尖压力逐渐降低。结果,DNA链的变形减少,并且可以通过末端提起高度来推断双链DNA(dsDNA)分子的高度。在提升模式下,dsDNA的测量高度为1.5±0.2 nm,而在常规敲击模式下仅为0.8±0.2 nm。这表明尖端压力是软样品高度测量中的关键因素,从而导致通过常规攻丝模式来确定较低的值。

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