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Advances in intellectual capital performance measurement: a state-of-the-art review

机译:智力资本绩效评估的最新进展:最新评论

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Purpose-The purpose of this paper is to present a review on the latest developments, approaches and methods in intellectual capital (IC) performance measurementDesign/methodology/approach-A total of 53 research papers from high-ranking journals concerning the advances in IC performance measurement were thoroughly reviewed and classified to identify the advanced approaches and methods that have been used to evaluate IC performance.Findings-It is clear that the current application of advanced or intelligent methods in IC performance measurement is still at the primary stage. The reviewed approaches mainly focus on two core applications. First is to assist the data collection or data handling process and second is to enhance the result computation process to obtain a more reliable and realistic value that represents the performance of IC.Research limitations/implications-This study offers a foundation and guideline for the researchers who wish to integrate advanced methods into IC performance measurement based on the reviewed advanced approaches in terms of their respective functions, strengths and limitations. It stimulates the creation of new IC performance measurement models that use advanced approaches to cope with real-life problems and dynamic conditions.Originality/value-This paper contributes to the literature on IC performance measurement, in light of advances in technology. In general, five advanced approaches were identified, analyzed and discussed. Future research directions were presented to provide new insights for researchers to apply advanced methods in IC performance measurement, together with theoretical and managerial implications.
机译:目的-本文的目的是对智力资本(IC)性能测量的最新发展,方法和方法进行综述设计/方法/方法-来自高级期刊的总共53篇关于IC性能进步的研究论文对测量进行了彻底的审查和分类,以识别用于评估IC性能的高级方法和方法。发现-显然,当前在IC性能测量中应用高级或智能方法仍处于初级阶段。审查的方法主要集中在两个核心应用程序上。首先是协助数据收集或数据处理过程,其次是增强结果计算过程以获得代表IC性能的更可靠,更现实的值。研究局限/含意-本研究为研究人员提供了基础和指南他们希望根据已审查的高级方法在功能,优势和局限性方面将高级方法集成到IC性能测量中。它刺激了使用先进方法来应对现实生活中的问题和动态条件的新型IC性能测量模型的创建。原创性/价值-本文随着技术的进步,为有关IC性能测量的文献做出了贡献。一般而言,确定,分析和讨论了五种高级方法。提出了未来的研究方向,以为研究人员在IC性能测量中应用高级方法提供新见解,并提供理论和管理方面的启示。

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