Toward a New Methodology for an Efficient Test of Reconfigurable Hardware Systems

摘要

This paper deals with the test of a reconfigurable hardware system (RHS). The latter is a hardware device that allows to change the hardware resources at runtime in order to modify the system functions and therefore to dynamically adapt the system to its environment. The increasing functional complexity of embedded systems and the transition to the RHS make the hardware testing a challenging task, especially under the confine of providing a high quality with a low cost. Considering the fact that the hardware test represents a key cost factor in a production process, an optimal test strategy can be advantageous in the competitive industrial market. Accordingly, this paper introduces a new methodology for an efficient hardware test of RHS. For an RHS, the number of stuck-at faults can be very large, which leads to a significant slowdown in the testing process. Because of the redundancy of faults between the different circuits composing an RHS, the proposed methodology aims at minimizing the number of faults using the inter-circuits relationships and consequently at providing an optimal fault set that can be effectively used for testing. Efficient techniques for test generation and test set validation are proposed to provide the test patterns for faults reduced by inter-circuits fault collapsing. The application of the generated test patterns is typically sufficient to provide an overall fault coverage. The proposed methodology is implemented in a new visual environment named TnTest. An experimental study confirms and validates the expected findings. Note to Practitioners-This paper addresses possible challenges for future generations of adaptive embedded systems. It proposes an original methodology for an efficient reconfigurable hardware system (RHS) hardware test. The main objective is to significantly reduce time and cost needed for the testing process. For an RHS, the number of stuck-at faults can be very large, which can cause a major slowdown in the hardware test. Based on the inter-circuits relations existing between the different circuits composing an RHS, the proposed methodology decreases considerably not only the number of the faults but also the test patterns needed for testing. The application of the generated test patterns is typically sufficient to provide an overall fault coverage. The proposed methodology is implemented in a new visual software environment named TnTest, which is capable of providing the smallest fault set as well as the efficient test set that can be effectively used for testing. This environment can be applied to test any embedded device that can be deployed in any new application based on flexible technologies. It can also be useful in manufacturing industries for a required improvement of the production process in relation to time and cost.