Surface potential measurements of a polymer film following primary ion gun irradiation for ToF-SIMS analysis of insulator using a Kelvin probe and the observation of effects from the vacuum gauge

Lee Sang Ju; Hong Aram; Kim Il Hee; Choi Chang Min; Min Boo Ki; Baek Ji Young; Choi Myoung Choul

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Surface potential measurements of a polymer film following primary ion gun irradiation for ToF-SIMS analysis of insulator using a Kelvin probe and the observation of effects from the vacuum gauge

机译：使用开菜探针的绝缘剂TOF-SIMS分析的初级离子枪照射后聚合物薄膜的表面电位测量结果和真空测量仪的影响

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《Applied Surface Science》 |2020年第30期|146561.1-146561.5|共5页
作者
Lee Sang Ju; Hong Aram; Kim Il Hee; Choi Chang Min; Min Boo Ki; Baek Ji Young; Choi Myoung Choul;
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Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

Korea Basic Sci Inst Ctr Sci Instrumentat Cheongju South Korea;

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机译：ITO薄膜的电导率的稳定性/不稳定性以及在空气或真空中紫外线照射下的ITO薄膜的功函数变化通过四探针法和开尔文力显微镜进行测量
2. Effects of Illumination Direction on the Surface Potential of CH3NH3PbI3 Perovskite Films Probed by Kelvin Probe Force Microscopy [J] . Yang Chao, Du Peng, Dai Zhensheng, ACS applied materials & interfaces . 2019,第15期

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4. Kelvin probe for surface potential measurements on epoxy insulators for HVDC applications [C] . M. Schueller, R. Gremaud, M. Baur, IEEE International Conference on High Voltage Engineering and Application . 2018

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Surface potential measurements of a polymer film following primary ion gun irradiation for ToF-SIMS analysis of insulator using a Kelvin probe and the observation of effects from the vacuum gauge

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