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Growth and characterization of undoped and aluminium doped zinc oxide thin films for SO_2 gas sensing below threshold value limit

机译:低于阈值极限的SO_2气敏非掺杂和铝掺杂氧化锌薄膜的生长和表征

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The present work explores the capability of undoped and aluminium doped zinc oxide thin films for the detection of low concentration of Sulphur dioxide gas (SO2). Highly transparent undoped and aluminium-doped ZnO thin films were successfully deposited using sol-gel spin coating technique. The influence of various concentrations of aluminium (Al) doping on structural, morphological, optical and electrical properties has been studied. The Al doping affected the crystallinity of the films as evident from the X-ray diffraction (XRD) studies. The Atomic force microscope (AFM) and the Field emission scanning electron microscope (FESEM) studies depict the wrinkled structure of the thin films. The transparency of the deposited films was revealed by the UV-Visible characterization. Electrical characterization showed a variation in the conductivity with varying aluminium concentration which influences the gas sensing performance of the thin films. The 2 at.% aluminium doped ZnO thin films exhibited a higher sensitivity of 70% for 3 ppm of SO2 gas which is below the threshold value limit. For comparison, NH3 gas sensing of the grown films was also studied.
机译:本工作探讨了未掺杂和铝掺杂的氧化锌薄膜检测低浓度二氧化硫气体(SO2)的能力。使用溶胶-凝胶旋涂技术成功地沉积了高度透明的未掺杂和铝掺杂的ZnO薄膜。研究了各种浓度的铝(Al)掺杂对结构,形态,光学和电学性质的影响。从X射线衍射(XRD)研究可以看出,Al掺杂影响了薄膜的结晶度。原子力显微镜(AFM)和场发射扫描电子显微镜(FESEM)的研究描绘了薄膜的起皱结构。沉积膜的透明性通过UV-可见特征来揭示。电气特性表明,随着铝浓度的变化,电导率也会发生变化,这会影响薄膜的气敏性能。 2at。%的铝掺杂ZnO薄膜对3 ppm的SO2气体显示出70%的更高灵敏度,低于阈值极限。为了进行比较,还研究了生长膜的NH3气体传感。

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