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首页> 外文期刊>Applied Surface Science >Stable hybrid organic/inorganic multiple-read quantum-dot memory devicev based on a PVK/QDs solution
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Stable hybrid organic/inorganic multiple-read quantum-dot memory devicev based on a PVK/QDs solution

机译:基于PVK / QDs解决方案的稳定的有机/无机多读量子点混合存储设备v

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摘要

A thin-film memory device is proposed herein, based on quantum dots (QDs) with bi-stable characteristics under a positive voltage bias. The synthesized QDs had a CdSe/ZnS core/shell structure. The charge confinement effect within the QDs in the charge-storage layer was enhanced by adding (poly(9-vinylcarbazole)) (PVK). As the PVK concentration increases, the on/off ratio of the device increases. Noise was also reduced and stable I-V characteristics were demonstrated. Each thin film was fabricated by a spin-coating method, among solution process methods. The on/off ratio of the fabricated device was found to be maximum 378 x 10(3) at 1.5 wt% PVK concentration. The initial on/off state was maintained even when a negative voltage (commonly used for the "erase" function) was applied. In addition, the write voltage of the fabricated device using the conductive polymer polyTPD was reduced from 2.8 to 1.7 V. By optimizing PVK concentration and forming the poly-TPD thin film, the fabricated memory device had an on/off ratio of about 4 x 10(3) at 0.5 V and the stored current maintained the initial value even after 200 h. Even with a single write process, the initially formed high state is maintained for more than 200 h, and it is possible to read repeatedly.
机译:本文提出了一种基于在正电压偏置下具有双稳态特性的量子点(QD)的薄膜存储器件。合成的量子点具有CdSe / ZnS核/壳结构。通过添加(聚(9-乙烯基咔唑))(PVK)可以增强电荷存储层中量子点内的电荷约束效应。随着PVK浓度的增加,设备的开/关比也增加。噪声也降低了,并且显示了稳定的I-V特性。在溶液加工方法中,通过旋涂法制造各薄膜。发现在1.5 wt%的PVK浓度下,制成的器件的开/关比最大为378 x 10(3)。即使施加了负电压(通常用于“擦除”功能),也保持了初始的开/关状态。此外,使用导电聚合物polyTPD制成的器件的写入电压从2.8 V降低到1.7V。通过优化PVK浓度并形成poly-TPD薄膜,制成的存储器件的开/关比约为4 x 10(3)在0.5 V电压下,即使经过200 h,存储电流仍保持初始值。即使使用一次写入过程,最初形成的高状态仍保持200小时以上,并且可以重复读取。

著录项

  • 来源
    《Applied Surface Science》 |2019年第1期|25-32|共8页
  • 作者单位

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

    KIST, Sensor Syst Res Ctr, 5 Hwarang Ro,14 Gil, Seoul 02792, South Korea;

    Daegu Technopk Mobile Technol Convergence Ctr, 46-17 Seongseogongdan Ro, Daegu 704801, South Korea;

    Dong A Carbon Technol Co, 41-3,Gyo 8 Gil, Chilgok Gun, Gyeongsangbuk D, South Korea;

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

    Kyungpook Natl Univ, Coll IT Engn, Sch Elect Engn, 1370 Sankyuk Dong, Daegu, South Korea;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    CdSe/ZnS quantum dots; Memory device; PVK; Poly-TPD; Multiple-read memory;

    机译:CdSe / ZnS量子点;存储器件;PVK;Poly-TPD;多次读取存储;

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