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Secondary ionization mass spectrometric analysis of impurity element isotope ratios in nuclear reactor materials

机译:核反应堆材料中杂质元素同位素比的二次电离质谱分析

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During reactor operations and fuel bum up, some isotopic abundances change due to nuclear reactions and provide sensitive indicators of neutron fluence and fuel burnup. Secondary ion mass spectrometry (SIMS) analysis has been used to measure isotope ratios of selected impurity elements in irradiated nuclear reactor graphite. Direct SIMS measurements were made in graphite samples, following shaping and surface cleaning. Models predicting local fuel burnup based on isotopic measurements of B and Li isotopes by SIMS agreed well with U and Pu isotopic measurements obtained by thermal ionization mass spectrometry (TIMS). (c) 2006 Elsevier B.V. All rights reserved.
机译:在反应堆运行和燃料燃烧期间,一些同位素丰度由于核反应而改变,并提供了中子通量和燃料燃烧的敏感指示。二次离子质谱(SIMS)分析已用于测量辐照核反应堆石墨中选定杂质元素的同位素比。在成型和表面清洁后,对石墨样品进行直接SIMS测量。基于SIMS对B和Li同位素的同位素测量预测局部燃料燃烧的模型与通过热电离质谱(TIMS)获得的U和Pu同位素测量非常吻合。 (c)2006 Elsevier B.V.保留所有权利。

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