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Optical And Electrical Properties Of P-type Zno Fabricated By Nh3 Plasma Post-treated Zno Thin Films

机译:Nh3等离子后处理Zno薄膜制备的P型Zno的光电性能

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In this paper, a simple method is reported to obtain nitrogen-doped p-ZnO film. In this method NH_3 plasma, generated in a plasma-enhanced chemical vapor deposition system, was employed to treat ZnO thin film. By Hall-effect measurement, a p-type conductivity was observed for the treated film with the hole density of 2.2 × 10~(16) cm~(-3). X-ray photoelectron spectroscopy (XPS) results confirmed that nitrogen was incorporated into ZnO film during the treatment process to occupy the oxygen positions. In low temperature photoluminescence spectra, an emission peak corresponding to acceptor-donor pair was observed. From this emission peak we calculated the N-related acceptor binding energy to be 130 meV.
机译:本文报道了一种简单的方法来获得氮掺杂的p-ZnO薄膜。在该方法中,采用在等离子体增强化学气相沉积系统中生成的NH_3等离子体处理ZnO薄膜。通过霍尔效应测量,观察到具有2.2×10〜(16)cm〜(-3)的空穴密度的处理过的膜的p型电导率。 X射线光电子能谱(XPS)结果证实,在处理过程中氮被掺入ZnO膜中以占据氧的位置。在低温光致发光光谱中,观察到对应于受体-供体对的发射峰。根据该发射峰,我们计算出与N相关的受体结合能为130 meV。

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