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Surface modification of ceria nanoparticles and their chemical mechanical polishing behavior on glass substrate

机译:二氧化铈纳米粒子的表面改性及其在玻璃基板上的化学机械抛光行为

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摘要

To improve their chemical mechanical polishing (CMP) performance, ceria nanoparticles were surface modified with γ-aminopropyltriethoxysilane (APS) through silanization reaction with their surface hydroxyl group. The compositions, structures and dispersibility of the modified ceria particles were characterized by Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), field-emission scanning electron microscopy (FE-SEM), energy dispersive spectroscopy (EDS), laser particle size analyzer, zeta potential measurement and stability test, respectively. The results indicated that APS had been successfully grafted onto the surface of ceria nanoparticles, which led to the modified ceria nanoparticles with better dispersibility and stability than unmodified ceria particles in aqueous fluids. Then, CMP performance of the modified ceria nanoparticles on glass substrate was investigated. Experimental results showed that the modified ceria particles exhibited lower material removal rate (MRR) but much better surface quality than unmodified ceria particles, which may be explained by the hardness reduction of ceria particles, the enhancement of lubrication of the particles and substrate surfaces, and the elimination of the agglomeration among the ceria particles.
机译:为了提高其化学机械抛光(CMP)性能,二氧化铈纳米颗粒通过与表面羟基的硅烷化反应用γ-氨基丙基三乙氧基硅烷(APS)进行了表面改性。通过傅里叶变换红外光谱(FTIR),X射线光电子能谱(XPS),场发射扫描电子显微镜(FE-SEM),能量色散能谱(EDS)表征了改性二氧化铈颗粒的组成,结构和分散性。激光粒度分析仪,ζ电势测量和稳定性测试。结果表明,APS已成功接枝到二氧化铈纳米颗粒的表面,从而使改性的二氧化铈纳米颗粒比未改性的二氧化铈颗粒在水性流体中具有更好的分散性和稳定性。然后,研究了改性二氧化铈纳米颗粒在玻璃基板上的CMP性能。实验结果表明,与未改性的二氧化铈相比,改性的二氧化铈具有较低的材料去除率(MRR),但其表面质量要好得多,这可能是由于二氧化铈颗粒的硬度降低,颗粒和基材表面的润滑性增强以及消除二氧化铈颗粒之间的团聚。

著录项

  • 来源
    《Applied Surface Science》 |2010年第12期|p.3856-3861|共6页
  • 作者单位

    State Key Laboratory of Functional Materials for Informatics, Laboratory of Nanotechnology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China Shanghai Xinanna Electronic Technology Co., Ltd., Shanghai 201506, China School of the Chinese Academy of Sciences, Beijing 100049, China;

    State Key Laboratory of Functional Materials for Informatics, Laboratory of Nanotechnology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China School of the Chinese Academy of Sciences, Beijing 100049, China;

    State Key Laboratory of Functional Materials for Informatics, Laboratory of Nanotechnology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China Shanghai Xinanna Electronic Technology Co., Ltd., Shanghai 201506, China;

    State Key Laboratory of Functional Materials for Informatics, Laboratory of Nanotechnology, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050, China Shanghai Xinanna Electronic Technology Co., Ltd., Shanghai 201506, China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    surface modification; ceria; γ-aminopropyltriethoxysilane; chemical mechanical polishing;

    机译:表面改性;氧化铈γ-氨基丙基三乙氧基硅烷;化学机械抛光;
  • 入库时间 2022-08-18 03:07:27

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