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Transparent conductive ITO/Cu/ITO films prepared on flexible substrates at room temperature

机译:在室温下在柔性基板上制备透明的ITO / Cu / ITO透明导电膜

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摘要

Transparent conductive ITO/Cu/ITO films were deposited on PET substrates by magnetron sputtering using three cathodes at room temperature. Effects of the SiO_2 buffer layer and thickness of Cu interlayer on the structural, electrical and optical properties of ITO/Cu/ITO films were investigated. The optical transmittance was affected slightly by SiO_2 buffer layer, but the electrical properties of ITO/Cu/ITO films were improved. The transmittance and resistivity of the SiO_2/ITO/Cu/ITO films decrease as the Cu layer thickness increases. The ITO/Cu/ITO film with 5 nm Cu interlayer deposited on the 40 nm thick SiO_2 buffer layer exhibits the sheet resistance of 143 fi/sq and transmittance of 65% at 550 nm wavelength. The optical and electrical properties of the ITO/Cu/ITO films were mainly dependent on the Cu layer.
机译:在室温下使用三个阴极通过磁控溅射将透明导电ITO / Cu / ITO膜沉积在PET基板上。研究了SiO_2缓冲层和Cu中间层厚度对ITO / Cu / ITO膜结构,电学和光学性质的影响。 SiO_2缓冲层对光的透射率有轻微的影响,但ITO / Cu / ITO膜的电学性能有所提高。随着Cu层厚度的增加,SiO_2 / ITO / Cu / ITO膜的透射率和电阻率降低。沉积在40 nm厚的SiO_2缓冲层上的具有5 nm Cu中间层的ITO / Cu / ITO膜在550 nm波长下的薄层电阻为143 fi / sq,透射率为65%。 ITO / Cu / ITO膜的光学和电学性质主要取决于Cu层。

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  • 来源
    《Applied Surface Science》 |2012年第7期|p.3082-3085|共4页
  • 作者单位

    School of Physics, Ludong University, Hongqi Road, No. 186, Yantai 264025, PR China;

    School of Physics, Ludong University, Hongqi Road, No. 186, Yantai 264025, PR China;

    School of Physics, Ludong University, Hongqi Road, No. 186, Yantai 264025, PR China;

    School of Physics, Ludong University, Hongqi Road, No. 186, Yantai 264025, PR China;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    indium tin oxide; copper; SiO_2 buffer layer; flexible substrate;

    机译:氧化铟锡铜;SiO_2缓冲层;柔性基板;
  • 入库时间 2022-08-18 03:06:44

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