Growth mechanisms for Si epitaxy on O atomic layers: Impact of O-content and surface structure

摘要

The epitaxial growth of Si layers on Si substrates in the presence of O atoms is generally considered a challenge, as O atoms degrade the epitaxial quality by generating defects. Here, we investigate the growth mechanisms for Si epitaxy on O atomic layers (ALs) with different O-contents and structures. O ALs are deposited by ozone (O-3) or oxygen (O-2) exposure on H-terminated Si at 50 degrees C and 300 degrees C respectively. Epitaxial Si is deposited by chemical vapor deposition using silane (SiH4) at 500 degrees C. After O-3 exposure, the 0 atoms are uniformly distributed in Si-Si dimer/back bonds. This O layer still allows epitaxial seeding of Si. The epitaxial quality is enhanced by lowering the surface distortions due to O atoms and by decreasing the arrival rate of SiH4 reactants, allowing more time for surface diffusion. After O-2 exposure, the O atoms are present in the form of SiOx clusters. Regions of hydrogen-terminated Si remain present between the SiOx clusters. The epitaxial seeding of Si in these structures is realized on H-Si regions, and an epitaxial layer grows by a lateral overgrowth mechanism. A breakdown in the epitaxial ordering occurs at a critical Si thickness, presumably by accumulation of surface roughness. (C) 2016 Elsevier B.V. All rights reserved.