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Raman and X-Ray photoelectron spectroscopic studies of graphene devices for identification of doping

机译:用于识别掺杂的石墨烯器件的拉曼光谱和X射线光电子能谱研究

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CTunability of electronic properties of graphene is one of the most promising properties to integrate it to high efficiency devices in the field of electronics. Here we demonstrate the substrate induced doping of CVD graphene devices using polymers with different functional groups. Both X-Ray secondary electron cut-off and Raman spectra confirm p-type doping of a PVC-Graphene film when compared to a PMMA-Graphene one. We also systematically analyzed the reversible doping effect of acid-base exposure and UV illumination to further dope/undope the polymer supported graphene devices. The shifts in the Raman 2D band towards lower and then to higher wavenumbers, with sequential exposure to ammonia and hydrochloric acid vapors, suggest n-type doing and restoration of graphene to its original state. Finally, the n-type doping with UV irradiation on half-covered samples was utilized and shown by both XPS and Raman to create two regions with different electronic properties and resistances. These type of controlled and reversible doping routes offer new paths for electronic devices especially towards fabricating graphene p-n junctions. (C) 2017 Elsevier B.V. All rights reserved.
机译:石墨烯的电子性质的不相容性是将其集成到电子领域的高效器件中最有希望的性质之一。在这里,我们展示了使用具有不同官能团的聚合物对CVD石墨烯器件进行衬底诱导的掺杂。与PMMA石墨烯薄膜相比,X射线二次电子截止光谱和拉曼光谱都证实了PVC石墨烯薄膜的p型掺杂。我们还系统地分析了酸碱暴露和紫外线照射的可逆掺杂效应,以进一步掺杂/不掺杂聚合物支撑的石墨烯器件。拉曼2D谱带向低波高移动,然后依次暴露于氨水和盐酸蒸气中,这表明石墨烯是n型的,并且可以恢复到其原始状态。最后,利用XPS和拉曼光谱对半覆盖样品的n型掺杂进行紫外线照射,以创建两个具有不同电子特性和电阻的区域。这些类型的受控和可逆掺杂路径为电子设备提供了新的途径,尤其是向制造石墨烯p-n结的方向。 (C)2017 Elsevier B.V.保留所有权利。

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