首页> 外文期刊>IEEE Transactions on Applied Superconductivity >The effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tape
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The effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tape

机译:最高加工温度对熔融加工的Ag包覆Bi / sub 2 / Sr / sub 2 / CaCu / sub 2 / O / sub x /胶带的显微结构和电性能的影响

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The critical current density (J/sub c/) is very sensitive to the maximum temperature (T/sub m/) used to melt process Ag-sheathed Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tapes. In this study we have found that the optimum T/sub m/ was 894-896/spl deg/C and that variations of /spl plusmn/2/spl deg/C strongly decreased J/sub c/. We found that the density of the oxide core and its Vickers hardness displayed a maximum in tapes that had been processed at the optimum T/sub m/. In addition, the room temperature electrical resistivity of the core was lowest for the tapes with the maximum J/sub c/ at 4.2 K. A formation of macropores was observed in tapes processed at T/sub m/ above the optimum one. MO imaging and SEM observation showed that the magnetic flux penetrates more easily into tape areas containing macropores. Together these observations show that T/sub m/ exerts a very powerful effect on the macroscopic density of the oxide core, this controlling the connectivity and the effective cross-section of the oxide core. Thus J/sub c/ depends on T/sub m/ primarily because the effective cross-section of the core depends on T/sub m/.
机译:临界电流密度(J / sub c /)对用于熔融处理Ag护套的Bi / sub 2 / Sr / sub 2 / CaCu / sub 2 / O / sub的最高温度(T / sub m /)非常敏感x /磁带。在这项研究中,我们发现最佳T / sub m /为894-896 / spl deg / C,/ spl plusmn / 2 / spl deg / C的变化极大地降低了J / sub c /。我们发现,在以最佳T / sub m /处理的带中,氧化物核的密度及其维氏硬度显示出最大值。此外,对于最大J / sub c /为4.2 K的胶带,芯部的室温电阻率最低。在高于最佳T / sub m /的胶带中观察到大孔的形成。 MO成像和SEM观察表明,磁通量更容易渗透到包含大孔的带状区域中。这些观察结果一起表明,T / sub m /对氧化物核的宏观密度产生非常强大的影响,这控制了氧化物核的连通性和有效横截面。因此,J / sub c /取决于T / sub m /,这主要是因为核心的有效横截面取决于T / sub m /。

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