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The distribution of transport current in YBCO coated conductor with zipper striations

机译:带拉链条纹的YBCO涂层导体中的传输电流分布

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An YBCO coated conductor with a zipper pattern striation is investigated by scanning laser microscopy (SLM). The distribution of transport current deduced from the VTSLM images shows that striations act as artificial barriers forcing the current to flow around them. Current sharing and redistribution are observed at the zipper area. We find the major dissipation mechanism in the sample in the superconducting state to be the current crowding at bottleneck areas. The bottleneck seems to be caused by the disabled filaments at and around the zipper area. Some filaments show the dissipation away from the zipper area. In general, we find that the lower J/sub c//sup */ areas have lower T/sub c//sup */ and high /spl delta/V/sub m/, which we consider as a sign of the current crowding. For the first time, we have demonstrated that there is a high temperature signature of the lower J/sub c//sup */ (high dissipation) area and VTSLM can detect the signature.
机译:通过扫描激光显微镜(SLM)研究了具有拉链图案条纹的YBCO涂层导体。从VTSLM图像推导出的传输电流的分布表明,条纹充当人为屏障,迫使电流在其周围流动。在拉链区域观察到电流共享和重新分布。我们发现样品在超导状态下的主要耗散机制是当前在瓶颈区域的拥挤情况。瓶颈似乎是由拉链区域及其周围禁用的细丝引起的。一些细丝显示出远离拉链区域的耗散。通常,我们发现较低的J / sub c // sup * /区域具有较低的T / sub c // sup * /和较高的/ spl delta / V / sub m /,我们认为这是当前的标志。拥挤。第一次,我们证明了较低的J / sub c // sup * /(高耗散)区域具有高温签名,并且VTSLM可以检测到签名。

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