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Transport AC Loss Measurements in Single- and Two-Layer Parallel Coated Conductor Arrays With Low Turn Numbers

机译:低匝数的单层和两层平行涂层导体阵列中的传输交流电损耗测量

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We measure transport ac losses in planar one-layer four-turn parallel coated conductor arrays (1 $times$ 4) and in two-layer (2L) four-turn parallel coated conductor arrays (2 $times$ 4) with a frequency up to 1 kHz. The horizontal separation between the conductors, i.e., $g_{h}$, and the vertical separation between the neighboring superconducting layers, i.e., $g_{v}$, were varied to investigate the transport ac loss dependence on $g_{h}$ and $g_{v}$ . In 2L arrays, the tapes in the top layer sit either aligned with the tapes in the bottom layer or aligned with the gaps between the tapes in the bottom layer. We show that the losses differently scale in arrays with low turn numbers to the scaling expected with an infinite array of tapes.
机译:我们测量频率上升的平面单层四匝平行涂覆导体阵列(1 $乘以4)和两层(2L)四匝平行涂覆导体阵列(2 $乘以4)的传输交流损耗。至1 kHz。改变导体之间的水平间距,即$ g_ {h} $和相邻的超导层之间的垂直间距,即$ g_ {v} $,以研究对$ g_ {h}的传输交流损耗依赖性$和$ g_ {v} $。在2L阵列中,顶层的胶带与底层的胶带对齐,或者与底层的胶带之间的间隙对齐。我们表明,损耗在低匝数的阵列中的缩放比例与无限磁带阵列所期望的缩放比例不同。

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