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首页> 外文期刊>Applied Physics Letters >Enhanced light emission of double heterostructured MgZnO/ZnO/MgZnO in ultraviolet blind light-emitting diodes deposited by vapor cooling condensation system
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Enhanced light emission of double heterostructured MgZnO/ZnO/MgZnO in ultraviolet blind light-emitting diodes deposited by vapor cooling condensation system

机译:蒸气冷却冷凝系统沉积的紫外盲发光二极管中双异质结构MgZnO / ZnO / MgZnO的增强发光

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摘要

The MgZnO/ZnO/MgZnO double heterostructure was deposited at low temperature by a vapor cooling condensation system to enhance the light emission of the ultraviolet p-AlGaN/i-MgZnO/i-ZnO/i-MgZnO-ZnO:In light-emitting diodes (ULEDs). The defect and vacancy concentrations of the deposited films were effectively reduced. The peak intensity and total emission power of the ultraviolet electroluminescence (EL) spectra of the ULEDs were 3.08 times and 1.82 times higher than those of the p-AlGaN/i-ZnO-ZnO:In ULEDs, respectively. Furthermore, the visible EL emission intensity induced by defect and vacancy in the ULEDs was negligible due to the high performances of the deposited active i-ZnO films.
机译:MgZnO / ZnO / MgZnO双异质结构在低温下通过蒸汽冷却冷凝系统沉积,以增强紫外线p-AlGaN / i-MgZnO / i-ZnO / i-MgZnO / n-ZnO的发光:发光二极管(ULED)。有效降低了沉积膜的缺陷和空位浓度。 ULED的紫外电致发光(EL)光谱的峰值强度和总发射功率分别比p-AlGaN / i-ZnO / n-ZnO:In ULED的峰值强度和总发射功率高3.08倍和1.82倍。此外,由于沉积的有源i-ZnO薄膜的高性能,ULED中的缺陷和空位引起的可见EL发射强度可以忽略不计。

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  • 来源
    《Applied Physics Letters》 |2012年第13期|p.1-3|共3页
  • 作者

    Wu Po-Ching;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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