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The discrepancies between theory and experiment in the optical emission of monolayer In(Ga)N quantum wells revisited by transmission electron microscopy

机译:透射电子显微镜对单层In(Ga)N量子阱光发射的理论与实验差异

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Quantitative high resolution transmission electron microscopy studies of intentionally grown 1InNGaN short-period superlattices (SLs) were performed. The structures were found to consist of an InxGa1−xN monolayer with an Indium content of x = 0.33 instead of the intended x = 1. Self-consistent calculations of the band structures of 1In0.33Ga0.67NGaN SLs were carried out, including a semi-empirical correction for the band gaps. The calculated band gap, Eg, as well as its pressure derivative, dEg/dp, are in very good agreement with the measured photoluminescence energy, EPL, and its pressure derivative, dEPL/dp, for a series of 1In0.33Ga0.67NGaN samples with n ranging from 2 to 40. This resolves a discrepancy found earlier between measured and calculated optical emission properties, as those calculations were made with the assumption of a 1InNGaN SL composition.
机译:对故意生长的1InN / nGaN短周期超晶格(SLs)进行了高分辨率的高分辨率透射电子显微镜研究。发现该结构由铟含量x = 0.33而不是预期的x = 1的InxGa1-xN单层组成。对1In0.33Ga0.67N / nGaN SL的能带结构进行了自洽计算,包括带隙的半经验校正。对于一系列1In0.33Ga0.67N /,计算得出的带隙Eg及其压力导数dEg / dp与测得的光致发光能量EPL及其压力导数dEPL / dp非常一致。 nGaN样品的n范围为2到40。这解决了较早发现的在测量和计算的光发射特性之间的差异,因为这些计算是在1InN / nGaN SL成分的假设下进行的。

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